X-ray qualification of hydrogenated amorphous silicon sensors on flexible substrate.
Mauro MenichelliL. AntogniniA. BashiriM. BizzarriL. CalcagnileM. CapraiAnna Paola CaricatoR. CatalanoG. A. P. CirroneT. CrociG. CuttoneS. DunandM. FabiLuca FrontiniC. GrimaniMaria IonicaKeida KanxheriM. LargeValentino LiberaliM. MartinoG. MaruccioG. MazzaA. G. MonteduroArianna MorozziFrancesco MoscatelliS. PallottaA. PapiDaniele PasseriM. PedioM. PetaseccaG. PetringaF. PeveriniL. PiccoloPisana PlacidiG. QuartaS. RizzatoG. RossiF. SabbatiniAlberto StabileLeonello ServoliC. TalamontiL. TostiM. VillaniR. J. WheadonNicolas WyrschN. ZemaPublished in: IWASI (2023)
Keyphrases
- x ray
- transmission electron microscopy
- semiconductor devices
- electron beam
- x ray images
- medical imaging
- digital x ray images
- intraoperative
- ct scans
- high density
- projection images
- high speed
- three dimensional
- real time
- thin film
- data fusion
- poor contrast
- dual energy
- multi sensor
- electron microscopy
- computer assisted
- metal oxide