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Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage.

John M. McGloneGuy BrizarDaniel VanderstraetenDorai IyerSallie HoseJeff P. Gambino
Published in: IRPS (2020)
Keyphrases
  • high temperature
  • storage and retrieval
  • data storage
  • neural network
  • data sets
  • databases
  • data structure
  • file system
  • storage systems
  • highly reliable
  • reliability analysis
  • reliability assessment
  • wire bonding