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2D-PPC: A single-correction multiple-detection method for Through-Silicon-Via Faults.
Khanh N. Dang
Michael Conrad Meyer
Akram Ben Ahmed
Abderazek Ben Abdallah
Xuan-Tu Tran
Published in:
APCCAS (2019)
Keyphrases
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detection method
detection algorithm
face detection
feature detection
fault diagnosis
image processing
object detection
low cost
scale space
noise reduction
saliency detection