Permanent shunts from passing shadows: Reverse-bias damage in thin-film photovoltaic modules.

Timothy J. Silverman Steve Johnston

Published in: IRPS (2018)

Keyphrases

thin film
solar cell
high density
short circuit
grain size
light source
multi layer
electron microscopy
single image
chance discovery
learning algorithm
shadow detection
control system
data analysis
neural network
plasma etching
white light interferometry