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Effect of bonding pressure on reliability of flip chip joints on flexible and rigid substrates.

Laura FriskAnne SeppäläEero Ristolainen
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • high density
  • high speed
  • low cost
  • modular design
  • outer sheath
  • lightweight
  • thin film
  • neural network
  • three dimensional
  • data center
  • degrees of freedom
  • reliability analysis
  • vlsi implementation