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Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability.
Kentaroh Katoh
Kazuteru Namba
Hideo Ito
Published in:
Inf. Media Technol. (2008)
Keyphrases
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test data
test cases
test set
training data
search based testing
data sets
real time
training set
test data generation
neural network
computer vision
error rate
training and test data
image processing
relational databases