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Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test.
Manobendra Nath Mondal
Animesh Basak Chowdhury
Manjari Pradhan
Susmita Sur-Kolay
Bhargab B. Bhattacharya
Published in:
ATS (2019)
Keyphrases
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test set
structure preserving
test data
test cases
error rate
training set
training data
random selection
high speed
evaluation methodology
dimensionality reduction
class distribution
computer vision
feature selection
information extraction