Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode.

Josh Yang Baosheng Wang André Ivanov

Published in: VLSI Design (2004)

Keyphrases

automatic detection
object detection
false alarms
detection algorithm
detection method
false positives
power consumption
detection accuracy
automated analysis
cell segmentation
database
real time
test data
statistical significance
defect detection
defect classification