Fast reliability analysis of combinatorial logic circuits using conditional probabilities.
Josep Torras FlaquerJean-Marc DaveauLirida A. B. NavinerPhilippe RochePublished in: Microelectron. Reliab. (2010)
Keyphrases
- design process
- conditional probabilities
- reliability analysis
- logic circuits
- low power
- bayesian networks
- probabilistic inference
- probability distribution
- probabilistic model
- functional decomposition
- random variables
- belief networks
- tunnel diode
- discrete random variables
- low cost
- class labels
- logistic regression
- power plant
- condition monitoring
- fuzzy logic
- high speed
- data analysis