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Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards.
Herold Levine
Charles Berking
Alan Blair
Kenneth R. Bowden
Peter deBruyn Kops
David Giles
David Ruhoff
Kenneth Wacks
Published in:
ITC (1982)
Keyphrases
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test generation
design automation
printed circuit boards
test cases
printed circuit
software testing
symbolic execution
test sequences
computer aided
static analysis
data conversion
open source
life cycle
circuit design
manufacturing process