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Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture.
Rajsekhar Adapa
Edward Flanigan
Spyros Tragoudas
Michael Laisne
Hailong Cui
Tsvetomir Petrov
Published in:
ISQED (2007)
Keyphrases
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test generation
test cases
mutation testing
test sequences
neural network
information systems
static analysis
symbolic execution
data sets
learning algorithm
computer vision
image processing
shortest path
database applications