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On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST.
Shigeyuki Oshima
Takaaki Kato
Senling Wang
Yasuo Sato
Seiji Kajihara
Published in:
ATS (2018)
Keyphrases
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built in self test
flip flops
integrated circuit
real time
multiple input
image sequences
signal processing
test cases