Reliability enhancement of power gating transistor under time dependent dielectric breakdown.
Hamid MahmoodiPublished in: VLSI-SoC (2012)
Keyphrases
- leakage current
- silicon dioxide
- power consumption
- high speed
- power dissipation
- low power
- image enhancement
- image processing
- electrical properties
- reliability analysis
- power distribution systems
- integrated circuit
- highly reliable
- transmission line
- low voltage
- power distribution
- information retrieval
- computational power
- travel time
- learning algorithm