Scan-Based BIST Diagnosis Using an Embedded Processor.
Kedarnath J. BalakrishnanNur A. ToubaPublished in: DFT (2003)
Keyphrases
- embedded processors
- fault diagnosis
- high speed
- medical diagnosis
- embedded systems
- model based diagnosis
- fault detection
- multiple faults
- single chip
- parallel processing
- dynamic random access memory
- attention deficit hyperactivity disorder
- computer architecture
- heart disease
- diagnostic reasoning
- clinically relevant
- causal reasoning
- signal processing
- low cost