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Test data compression technique for embedded cores using virtual scan chains.
Abhijit Jas
Bahram Pouya
Nur A. Touba
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2004)
Keyphrases
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test data
test cases
test set
training data
training set
search based testing
image compression
data sets
small number
dynamic random access memory
data mining
decision trees
computer vision
machine learning
databases
simulated annealing
learning algorithm