Electrical Resistance Tomography of Conductive Thin Films.

Alessandro Cultrera Luca Callegaro

Published in: IEEE Trans. Instrum. Meas. (2016)

Keyphrases

thin film
short circuit
image reconstruction
high density
tomographic reconstruction
multi layer
solar cell
machine learning
grain size
control system
viewpoint
limited angle
electrical properties
film thickness
chemical vapor deposition
plasma etching
transmission line
database
iterative reconstruction