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Extracting a Close-to-Minimum Multicycle Functional Broadside Test Set From a Functional Test Sequence.

Irith Pomeranz
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2019)
Keyphrases
  • test set
  • error rate
  • test data
  • training set
  • training data
  • test cases
  • machine learning
  • random selection
  • database
  • data sets
  • data mining
  • support vector
  • feature space
  • multi class
  • evaluation methodology