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WOR-BIST: A Complete Test Solution for Designs Meeting Power, Area and Performance Requirements.
Chunhua Yao
Kewal K. Saluja
Abhishek A. Sinkar
Published in:
VLSI Design (2009)
Keyphrases
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power consumption
low power
statistical tests
built in self test
data sets
machine learning
multiscale
test cases
statistically significant
test data
solution space
solution quality
design principles