Hybrid FE-BIM for electromagnetic scattering from a dielectric target above a dielectric rough surface.

Li-Xin Guo Run-Wen Xu

Published in: IGARSS (2014)

Keyphrases

multiple scattering
silicon dioxide
electrical properties
film thickness
three dimensional
finite element
rough sets
surface reconstruction
electron microscope
chemical vapor deposition
neural network
data mining
light source
object surface
transmission line
smooth surfaces