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Generating Representative Test Sequences from Real Workload for Minimizing DRAM Verification Overhead.

Yoonah PaikSeon Wook KimDongha JungMinseong Kim
Published in: ACM Trans. Design Autom. Electr. Syst. (2020)
Keyphrases
  • test sequences
  • test generation
  • test cases
  • low overhead
  • bit rate
  • mutation testing
  • video sequences
  • model checking
  • high density
  • database systems
  • image quality