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Generating Representative Test Sequences from Real Workload for Minimizing DRAM Verification Overhead.
Yoonah Paik
Seon Wook Kim
Dongha Jung
Minseong Kim
Published in:
ACM Trans. Design Autom. Electr. Syst. (2020)
Keyphrases
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test sequences
test generation
test cases
low overhead
bit rate
mutation testing
video sequences
model checking
high density
database systems
image quality