Outlier detection for single particle analysis in Electron Microscopy.
Carlos Oscar Sánchez SorzanoJavier VargasJosé Miguel de la Rosa-TrevínAiren Zaldívar-PerazaJoaquín OtónVahid AbrishamiIgnacio FocheRoberto MarabiniGabriel CaffarenaJosé María CarazoPublished in: IWBBIO (2014)