Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage.
Daisuke FujimotoNoriyuki MiuraMakoto NagataYu-ichi HayashiNaofumi HommaTakafumi AokiYohei HoriToshihiro KatashitaKazuo SakiyamaThanh-Ha LeJulien BringerPirouz Bazargan-SabetShivam BhasinJean-Luc DangerPublished in: IEICE Trans. Electron. (2014)