Crystallinity Dependence of Long-Term Reliability of Electroplated Gold Thin-Film Interconnections.

Ken Suzuki Ryota Mizuno Yutaro Nakoshi Hideo Miura

Published in: 3DIC (2019)

Keyphrases

thin film
long term
high density
short term
short circuit
solar cell
electron microscopy
grain size
low density
multi layer
neural network
data center
room temperature
plasma etching
shape from shading
single image
fuzzy logic
query processing
database systems
decision making
chemical vapor deposition
database