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Comparisons of instability in device characteristics at high temperature for thin-film SOI power n- and p- channel MOSFETs.
Masanobu Kaneda
Kazuma Ariyoshi
Satoshi Matsumoto
Published in:
TENCON (2020)
Keyphrases
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thin film
high temperature
short circuit
high density
field effect transistors
grain size
power consumption
silicon on insulator
electron microscopy
solar cell
chemical vapor deposition
liquid crystal displays
diesel engine
low power
project management
data warehouse
white light interferometry