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Reliability modelling for packages in flexible end-products.

W. D. van DrielOlaf van der SluisDao-Guo YangR. L. J. M. UbachsC. ZenzG. AflenzerG. Q. Zhang
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • lightweight
  • neural network
  • real world
  • image processing
  • failure rate