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Reliability modelling for packages in flexible end-products.
W. D. van Driel
Olaf van der Sluis
Dao-Guo Yang
R. L. J. M. Ubachs
C. Zenz
G. Aflenzer
G. Q. Zhang
Published in:
Microelectron. Reliab. (2006)
Keyphrases
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lightweight
neural network
real world
image processing
failure rate