Automated defect inspection of LED chip using deep convolutional neural network.
Hui LinBin LiXinggang WangYufeng ShuShuanglong NiuPublished in: J. Intell. Manuf. (2019)
Keyphrases
- convolutional neural network
- defect detection
- face detection
- automated visual inspection
- semi automated
- high speed
- analog vlsi
- low cost
- fully automated
- printed circuit boards
- feature extraction
- neural network
- programmable logic
- visual inspection
- automated analysis
- deep learning
- quality control
- computer aided
- operating system
- evolutionary algorithm
- learning algorithm
- real time