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X-Calibration: A Technique for Combating Excessive Bitline Leakage Current in Nanometer SRAM Designs.

Ya-Chun LaiShi-Yu Huang
Published in: IEEE J. Solid State Circuits (2008)
Keyphrases
  • leakage current
  • low voltage
  • electrical properties
  • camera calibration
  • silicon dioxide
  • power line
  • electron microscopy
  • law enforcement
  • design considerations