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X-Calibration: A Technique for Combating Excessive Bitline Leakage Current in Nanometer SRAM Designs.
Ya-Chun Lai
Shi-Yu Huang
Published in:
IEEE J. Solid State Circuits (2008)
Keyphrases
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leakage current
low voltage
electrical properties
camera calibration
silicon dioxide
power line
electron microscopy
law enforcement
design considerations