Guided Test Generation for Finding Worst-Case Stack Usage in Embedded Systems.
Tingting YuMyra B. CohenPublished in: ICST (2015)
Keyphrases
- embedded systems
- test generation
- worst case
- low cost
- computing power
- embedded devices
- embedded software
- test cases
- resource limited
- processing power
- real time image processing
- design automation
- test sequences
- real time systems
- symbolic execution
- upper bound
- flash memory
- static analysis
- software testing
- hw sw
- software systems
- lower bound
- computational complexity
- regression testing
- embedded real time systems
- consumer electronics
- real world
- hardware software
- quality assurance
- software development
- knowledge management
- open source