Storage-Based Logic Built-in Self-Test With Multicycle Tests.
Irith PomeranzPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
- built in self test
- integrated circuit
- data storage
- logic programming
- storage requirements
- storage and retrieval
- real time
- storage space
- statistical tests
- test cases
- data mining
- data sets
- description logics
- knowledge representation
- expert systems
- artificial intelligence
- probabilistic logic
- storage devices
- processing capabilities
- digital circuits
- proof theory
- database
- mass storage