Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors.
Mireia Bargallo GonzálezMarcos Maestro-IzquierdoFrancesca CampabadalSamuel AldanaFrancisco Jiménez-MolinosJuan Bautista RoldánPublished in: IRPS (2020)