Oxide reliability below 3 nm for advanced CMOS: Issues, characterization, and solutions.

Didier Goguenheim D. Pic Jean-Luc Ogier

Published in: Microelectron. Reliab. (2007)

Keyphrases

high speed
computational issues
metal oxide
neural network
power consumption
key issues
optimal solution
benchmark problems
transmission electron microscopy
parallel processing
power supply
cmos technology
technical solutions
topics covered include