D. Pic

Publication Activity (10 Years)

Years Active: 2007-2008
Publications (10 Years): 0

Publications

D. Pic, Arnaud Régnier, V. Pean, Jean-Luc Ogier, Didier Goguenheim
Dynamic stress method for accurate NVM oxide robustness evaluation for automotive applications. Microelectron. Reliab. 48 (8-9) (2008)
D. Pic, Didier Goguenheim, Jean-Luc Ogier
thin oxides stressed to hard breakdown. Microelectron. Reliab. 48 (3) (2008)
Didier Goguenheim, D. Pic, Jean-Luc Ogier
Oxide reliability below 3 nm for advanced CMOS: Issues, characterization, and solutions. Microelectron. Reliab. 47 (9-11) (2007)
D. Pic, Didier Goguenheim, Jean-Luc Ogier
A comprehensive study of stress induced leakage current using a floating gate structure for direct applications in EEPROM memories. Microelectron. Reliab. 47 (9-11) (2007)