Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits.
Dipak Kumar KoleHafizur RahamanDebesh K. DasBhargab B. BhattacharyaPublished in: ISED (2011)
Keyphrases
- test set
- test cases
- error rate
- training set
- dermoscopy images
- detection method
- training data
- test data
- missing data
- detection rate
- class distribution
- detection accuracy
- data sets
- high speed
- object detection
- evaluation methodology
- detection algorithm
- false positives
- automated detection
- cmos technology
- markov chain
- random selection