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Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition.
M. Millesimo
Benoit Bakeroot
Matteo Borga
Niels Posthuma
Stefaan Decoutere
Enrico Sangiorgi
Claudio Fiegna
Andrea Natale Tallarico
Published in:
IRPS (2022)
Keyphrases
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sufficient conditions
multiple input
power distribution systems
nano scale
databases
real world
artificial intelligence
e learning
power system
steady state
power consumption
structuring elements
electricity markets
reliability analysis
software reliability