Accelerating electromigration aging for fast failure detection for nanometer ICs.

Zeyu Sun Sheriff Sadiqbatcha Hengyang Zhao Sheldon X.-D. Tan

Published in: ASP-DAC (2018)

Keyphrases

failure detection
failure diagnosis
fault detection
electron microscopy
age estimation
age related
highly reliable
software aging
information systems
feature selection
wet lab
real time
computer vision
website
case based reasoning
human perception