AI on edge device for laser chip defect detection.
Dennis HouTuo LiuYen-Ting PanJanpu HouPublished in: CCWC (2019)
Keyphrases
- defect detection
- artificial intelligence
- feature extraction
- edge detection
- high speed
- edge information
- low cost
- machine learning
- case based reasoning
- ai systems
- ai methods
- analog vlsi
- automated visual inspection
- expert systems
- single chip
- textured surfaces
- weighted graph
- physical design
- edge map
- programmable logic
- scanning devices
- john mccarthy
- lecture notes in artificial intelligence
- intelligent systems
- computational intelligence
- knowledge representation
- multiscale
- circuit design
- high density
- intelligent behavior
- edge detector
- data acquisition
- knowledge based systems
- ai technologies