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Determining Thin Film Characteristics by Prism Coupling Technique.

Paulo LourençoYuri VygranenkoJoão CostaMiguel FernandesAlessandro FantoniManuela VieiraG. Lavareda
Published in: DoCEIS (2024)
Keyphrases
  • thin film
  • high density
  • solar cell
  • multi layer
  • grain size
  • databases
  • room temperature
  • short circuit
  • learning algorithm
  • artificial neural networks
  • chemical vapor deposition
  • plasma etching
  • white light interferometry