Testing of Analog Circuits using Statistical and Machine Learning Techniques.
Supriyo SrimaniHafizur RahamanPublished in: ITC (2022)
Keyphrases
- analog circuits
- fault diagnosis
- digital circuits
- statistical methods
- statistical analysis
- wavelet packet transform
- machine learning methods
- machine learning
- machine learning algorithms
- statistical models
- statistical tests
- test cases
- statistical information
- information theoretic
- neural network
- real time
- test set
- data driven
- fuzzy logic
- expert systems
- computer vision
- data sets