BIST hardware generator for mixed test scheme.
Christian DufazaH. ViallonCyril ChevalierPublished in: ED&TC (1995)
Keyphrases
- protection scheme
- vlsi implementation
- built in self test
- real time
- low cost
- test cases
- statistical tests
- database
- multiresolution
- data structure
- hardware implementation
- hardware and software
- high speed
- personal computer
- data acquisition
- test data
- classification scheme
- computing systems
- statistical significance
- control program
- image processing
- general purpose