An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern.
Shaokun LanHongcheng FanShiqi HuXincheng RenXuewen LiaoZhibin PanPublished in: Expert Syst. Appl. (2023)
Keyphrases
- selection strategy
- local binary pattern
- selection strategies
- texture classification
- multiscale
- spatial information
- binary patterns
- rotation invariant
- texture features
- texture analysis
- face recognition
- texture descriptors
- edge detection
- texture information
- illumination invariant
- image features
- edge information
- feature extraction
- selection algorithm
- optimal solution
- genetic algorithm
- data sets
- pattern recognition
- feature set
- multi class
- machine learning
- feature space