Gate sizing and threshold voltage assignment for high performance microprocessor designs.
Tiago ReimannCliff C. N. SzeRicardo ReisPublished in: ASP-DAC (2015)
Keyphrases
- power losses
- field effect transistors
- nm technology
- high speed
- power system
- high reliability
- design methodology
- silicon dioxide
- short circuit
- special purpose hardware
- transmission line
- threshold selection
- high voltage
- computational intelligence
- power consumption
- embedded dram
- signal processing
- nano scale
- multiple input
- electric field
- physical design
- power supply
- design space
- high density
- design principles