Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients.
Suraj SindiaVishwani D. AgrawalVirendra SinghPublished in: J. Electron. Test. (2012)
Keyphrases
- analog circuits
- fault diagnosis
- transform coefficients
- transform domain
- reconstructed image
- neural network
- subband
- coding scheme
- expert systems
- digital circuits
- reconstruction error
- high quality
- fuzzy logic
- spatial domain
- image quality
- bit rate
- post processing
- low cost
- ground truth
- image data
- multiresolution
- knowledge base
- computer vision