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Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation.

Xiaoqing WenKohei MiyaseTatsuya SuzukiYuta YamatoSeiji KajiharaLaung-Terng WangKewal K. Saluja
Published in: ICCD (2006)
Keyphrases
  • significant improvement
  • detection method
  • error rate
  • metadata
  • data sets
  • computer vision
  • image data
  • computationally efficient
  • matching algorithm
  • test generation