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Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation.
Xiaoqing Wen
Kohei Miyase
Tatsuya Suzuki
Yuta Yamato
Seiji Kajihara
Laung-Terng Wang
Kewal K. Saluja
Published in:
ICCD (2006)
Keyphrases
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significant improvement
detection method
error rate
metadata
data sets
computer vision
image data
computationally efficient
matching algorithm
test generation