A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells.

Freddy Forero Jean Marc Gallière Michel Renovell Víctor H. Champac

Published in: LATS (2019)

Keyphrases

analytical model
analytical models
high speed
simulation model
classical logic
wastewater treatment
multi valued
logic programming
bit error rate
modal logic
visual cortex
defeasible logic
defect detection
predicate logic
automated reasoning
automated visual inspection
default theories
proof theory