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Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction.
Yoshinobu Higami
Seiji Kajihara
Shin-ya Kobayashi
Yuzo Takamatsu
Published in:
Asian Test Symposium (2004)
Keyphrases
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test sequences
power reduction
power consumption
test cases
low power
test generation
bit rate
power saving
video sequences
power dissipation
high speed
test suite
software testing
high quality
low complexity
data partitioning