DETECTive: Machine Learning-driven Automatic Test Pattern Prediction for Faults in Digital Circuits.
Vincenzo PetroloSourav MedyaMariagrazia GrazianoDebjit PalPublished in: ACM Great Lakes Symposium on VLSI (2024)
Keyphrases
- digital circuits
- machine learning
- model based diagnosis
- test cases
- data driven
- prediction accuracy
- pattern matching
- fault diagnosis
- evolvable hardware
- circuit design
- data flow
- knowledge acquisition
- pattern recognition
- reinforcement learning
- data mining
- machine learning methods
- prediction model
- learning algorithm
- semi automatic
- finite state machines
- explanation based learning
- built in self test
- text classification
- constraint programming
- natural language processing
- artificial intelligence