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Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing.

K. G. DeepakRobinson ReynaVirendra SinghAdit D. Singh
Published in: Asian Test Symposium (2009)
Keyphrases
  • fault diagnosis
  • fault model
  • artificial intelligence
  • test set
  • test cases
  • improved algorithm
  • fault injection
  • information systems
  • case study