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Logic systems for path delay test generation.

Soumitra BosePrathima AgrawalVishwani D. Agrawal
Published in: EURO-DAC (1993)
Keyphrases
  • test generation
  • asynchronous circuits
  • design automation
  • modal logic
  • data sets
  • artificial intelligence
  • high level
  • test cases
  • life cycle
  • project management
  • quality assurance
  • symbolic execution