Functional Test Generation for LSI Circuits Described by Binary Decision Diagrams.

Magdy S. Abadir Hassan K. Reghbati

Published in: ITC (1985)

Keyphrases

training data
test generation
binary decision diagrams
test cases
quality assurance
boolean functions
symbolic model checking
design automation
static analysis
model checking
software testing
planning problems
circuit design
high level
database
machine vision
information extraction
data model
search algorithm