Unveiling Thermal Cross Talk in 5nm Gate-All-Around Stacked Nanosheet FETs: A Machine Learning Perspective.
Vivek KumarNischal AnandRohit RaiSneha ChauhanJyoti PatelPublished in: VLSID (2024)
Keyphrases
- cmos technology
- leakage current
- electrical properties
- nm technology
- infrared
- low power
- metal oxide semiconductor
- power consumption
- multiple input
- power plant
- databases
- thermal images
- parallel processing
- low cost
- high temperature
- artificial intelligence
- nano scale
- thermal conductivity
- silicon on insulator
- transmission electron microscopy
- field effect transistors
- visible spectrum
- machine learning